Modeling nanoscale imaging in electron microscopy

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Modeling nanoscale imaging in electron...

Modeling nanoscale imaging in electron microscopy

Name: Modeling nanoscale imaging in electron microscopy
ISBN: 9781461421917

Michael Dickson (auth.), Thomas Vogt, Wolfgang Dahmen, Peter Binev (eds.)

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Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

श्रेणियाँ:

Engineering

साल:

2012

संस्करण:

प्रकाशन:

Springer-Verlag New York

भाषा:

english

पृष्ठ:

182

ISBN 10: