Fundamentals of Atomic Force Microscopy: Part I:...

Fundamentals of Atomic Force Microscopy: Part I: Foundations

Ronald Reifenberger
यह पुस्तक आपको कितनी अच्छी लगी?
फ़ाइल की गुणवत्ता क्या है?
पुस्तक की गुणवत्ता का मूल्यांकन करने के लिए यह पुस्तक डाउनलोड करें
डाउनलोड की गई फ़ाइलों की गुणवत्ता क्या है?
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.

Useful as a study guide to Fundamentals of AFM. This title is also suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Readership: Advanced undergraduates and graduates in physics, chemistry, materials science and engineering disciplines with an interest in Atomic Force Microscopy and its applications in nanotechnology.

श्रेणियाँ:
साल:
2016
प्रकाशन:
World Scientific Publishing Co
भाषा:
english
पृष्ठ:
340
ISBN 10:
9814630349
ISBN 13:
9789814630344
श्रृंखला:
Lessons from Nanoscience: A Lecture Notes Vol. 4
फ़ाइल:
PDF, 13.27 MB
IPFS:
CID , CID Blake2b
english, 2016
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